O. Sugiyama et al., Determination of Pb/(Zr plus Ti) and Zr/(Zr plus Ti) ratios of lead zirconate titanate surface by x-ray photoelectron spectroscopy, JPN J A P 1, 38(9B), 1999, pp. 5461-5464
The quantitative analysis of the surface of lead zirconate titanate (PZT) c
eramics, the compositions of which were in the ranges of 0.1 < Zr/(Zr + Ti)
< 0.9 and 0.8 < Pb/(Zr + Ti) < 1.2, was conducted using X-ray photoelectro
n spectroscopy (XPS). The linear relationship between the corresponding XPS
intensities and the atomic ratio Zr/(Zr + Ti) could be obtained as a calib
ration equation. Here, the newly derived proportionality factor was introdu
ced for the cancellation of the systematic errors. The calibration equation
for the atomic ratio Pb/(Zr + Ti) was also obtained in the same way. The 9
9.9% confidence intervals of the calibration equations for Zr/(Zr + Ti) and
for Pb/(Zr + Ti) were all +/-2% and +/-3%, respectively, although they nar
rowed to +/-1% around the compositions of Zr/(Zr + Ti) = 0.5 and Pb/(Zr + T
i) = 1.0. This analytical method was successfully applied to the follow-up
of the compositional change of the surface of the PZT ceramics through sepa
rate acid and heat treatments.