Y. Muramatsu et al., High-resolution soft X-ray emission spectra of crystalline carbon nitride films deposited by electron cyclotron resonance sputtering, JPN J A P 1, 38(9A), 1999, pp. 5143-5147
The X-ray emission spectra of crystalline carbon nitride films deposited by
electron-cyclotron-resonance (ECR) plasma sputtering were observed using a
high-resolution soft X-ray spectrometer at the Advanced Light Source to in
vestigate the electronic structure of carbon nitride crystals. The spectral
features in C K and N K X-ray emissions from the ECR-deposited carbon nitr
ide films represent the highly degenerated valence orbitals and their highl
y pure crystalline form. The C K and NK X-ray emission spectra were approxi
mately explained based on the C2p and N2p density of states in the hybridiz
ed C-N bonds. The absence of significant peak shifting in selectively excit
ed C K and N K X-ray emission spectra showed that there is a fairly nondisp
ersive structure between valence and conduction bands in ECR-deposited carb
on nitride films.