X-ray fluorescence spectrometry

Citation
Pj. Potts et al., X-ray fluorescence spectrometry, J ANAL ATOM, 14(11), 1999, pp. 1773-1799
Citations number
531
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
ISSN journal
02679477 → ACNP
Volume
14
Issue
11
Year of publication
1999
Pages
1773 - 1799
Database
ISI
SICI code
0267-9477(1999)14:11<1773:XFS>2.0.ZU;2-J
Abstract
This annual review of X-ray fluorescence covers papers published over the p eriod 1998-1999 that are judged to have made a significant contribution to this branch of the analytical sciences. The review is both comprehensive in scope and selective in the choice of contributions included. The scope inc ludes developments in instrumentation and detectors, matrix correction and spectrum analysis software, X-ray optics and microfluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications. Also included is a revie w of applications, including sample preparation, geological, environmental, archaeological, forensic, biological, clinical, thin films and chemical st ate analysis, including speciation. Highlights of this year include further work in the development of high resolution detector devices based on both microcalorimeters and superconducting tunnel junction devices. However, the re continue to be important developments in capillary X-ray optics, portabl e XRF, on-line applications, TXRF and synchrotron radiation devices. Furthe rmore, it is noteworthy that XRF continues to make an essential contributio n in a wide range of applications where the non-destructive, high precision , simple sample preparation techniques and well-characterised spectrum inte rpretation and quantification procedures can be used to advantage.