On the methods of beam direction and misorientation angle/axis determination by systematic tilt

The methods for determining electron beam direction and misorientation angl e/axis of grain boundaries are described in this paper. The present methods are based on a series of diffraction spot patterns obtained by systematic tilt of the crystal, combined with simple mathematical calculations. Instea d of the use of Kikuchi patterns, the limitations resulting from the visibi lity or sharpness of Kikuchi lines and the number of Kikuchi pole(s) existe d are avoided and a sufficient accuracy of determination has been achieved.