Cross-sectional characterization of the interfacial zone of SiTiCf/C/TiAl composites by transmission electron microscope

Authors
Suzuki, T Guo, XL Umehara, H Terauchi, S
Citation
T. Suzuki et al., Cross-sectional characterization of the interfacial zone of SiTiCf/C/TiAl composites by transmission electron microscope, J MAT SCI L, 18(22), 1999, pp. 1799-1801
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
18
Issue
22
Year of publication
1999
Pages
1799 - 1801
Database
ISI
SICI code
0261-8028(199911)18:22<1799:CCOTIZ>2.0.ZU;2-2