Physics and characterization of transient effects in SOI transistors

Citation
Al. Lacaita et Lm. Perron, Physics and characterization of transient effects in SOI transistors, MICROEL ENG, 48(1-4), 1999, pp. 319-326
Citations number
26
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
48
Issue
1-4
Year of publication
1999
Pages
319 - 326
Database
ISI
SICI code
0167-9317(199909)48:1-4<319:PACOTE>2.0.ZU;2-R
Abstract
The work reviews the physics of transient floating-body effects in SOI devi ces and gives some examples of their impact on circuit performance.