Imaging shear in sliding charge-density waves by X-ray diffraction topography

Citation
Y. Li et al., Imaging shear in sliding charge-density waves by X-ray diffraction topography, PHYS REV L, 83(17), 1999, pp. 3514-3517
Citations number
35
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
83
Issue
17
Year of publication
1999
Pages
3514 - 3517
Database
ISI
SICI code
0031-9007(19991025)83:17<3514:ISISCW>2.0.ZU;2-3
Abstract
We have imaged the electric-field-dependent structure of charge-density wav es (CDWs) in ribbonlike NbSe3 single crystals by monochromatic x-ray topogr aphy. Below the depinning threshold E-T the CDW is well correlated. Just ab ove E-T, the CDW shears along longitudinal steps in crystal thickness assoc iated with small-angle grain boundaries, and at high fields transverse corr elations recover. These results demonstrate x-ray topography as an effectiv e probe of superlattice structure and with earlier transport measurements e stablish that extrinsic sources dominate CDW plasticity observed in NbSe3.