COATING TECHNIQUES IN OPTICAL INTERFEROMETRIC METROLOGY

Citation
Jjj. Dirckx et Wf. Decraemer, COATING TECHNIQUES IN OPTICAL INTERFEROMETRIC METROLOGY, Applied optics, 36(13), 1997, pp. 2776-2782
Citations number
5
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
36
Issue
13
Year of publication
1997
Pages
2776 - 2782
Database
ISI
SICI code
0003-6935(1997)36:13<2776:CTIOIM>2.0.ZU;2-O
Abstract
In optical interferometry diffuse reflectivity of the surface under st udy should be high and homogeneous. Application of a white reflective coating can strongly improve measurement results. The optical properti es of bronze powder, TiO2 powder, white Chinese ink, and MgO coatings are discussed. Measurements of reflected intensity distribution show t hat white Chinese ink and MgO have superior optical characteristics, a nd electron microscopy shows that these coatings cause thickness artif acts of less than 7.5 and 17 mu m, respectively. The effect on deforma tion measurements is demonstrated by moire topography on a thin membra ne that is deformed under small static pressures. The membrane center displacement varies from 15 to 100 mu m, and within a measuring precis ion of 2.5 mu m no artifacts on this deformation are found. (C) 1997 O ptical Society of America.