Determination of single-pass optical gain and internal loss using a multisection device

Citation
Jd. Thomson et al., Determination of single-pass optical gain and internal loss using a multisection device, APPL PHYS L, 75(17), 1999, pp. 2527-2529
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
17
Year of publication
1999
Pages
2527 - 2529
Database
ISI
SICI code
0003-6951(19991025)75:17<2527:DOSOGA>2.0.ZU;2-X
Abstract
We describe a technique for the measurement of optical gain and loss in sem iconductor lasers using a single, multisection device. The method provides a complete description of the gain spectrum in absolute units and over a wi de current range. Comparison of the transverse electric and transverse magn etic polarized spectra also provides the quasi-Fermi-level energy separatio n. Measurements on AlGaInP quantum well laser structures with emission wave lengths close to 670 nm show an internal loss of 10 cm(-1) and peak gain va lues up to 4000 cm(-1) for current densities up to 4 kA cm(-2). (C) 1999 Am erican Institute of Physics. [S0003-6951(99)04243-6].