Atomic structure of Ba0.5Sr0.5TiO3 thin films on LaAlO3

Citation
Hj. Gao et al., Atomic structure of Ba0.5Sr0.5TiO3 thin films on LaAlO3, APPL PHYS L, 75(17), 1999, pp. 2542-2544
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
17
Year of publication
1999
Pages
2542 - 2544
Database
ISI
SICI code
0003-6951(19991025)75:17<2542:ASOBTF>2.0.ZU;2-1
Abstract
Perovskite barium strontium titanate Ba0.5Sr0.5TiO3(BST) thin films were gr own on (001) LaAlO3 (LAO) using pulsed-laser ablation. The microstructures of the as-grown BST films were studied with selected electron diffraction, transmission electron microscopy, and scanning transmission electron micros copy. The BST thin films are oriented with their [001] directions parallel to the < 102 > directions of the LAO. Both cross-sectional and plan-view st udies show the BST films to be single crystals with smooth surfaces. The in terfaces were seen to be atomically sharp by cross-sectional, high-resoluti on electron microscopy. The density of misfit dislocations was consistent w ith the 4.3% lattice mismatch, and they were found to be dissociated into p artials. (C) 1999 American Institute of Physics. [S0003-6951(99)00443-X].