A (2 root 3 x 2 root 13) surface phase in the 6H-SiC(0001) surface studiedby scanning tunneling microscopy (vol 75, pg 650, 1999)

Authors
Naitoh, M Takami, J Nishigaki, S Toyama, N
Citation
M. Naitoh et al., A (2 root 3 x 2 root 13) surface phase in the 6H-SiC(0001) surface studiedby scanning tunneling microscopy (vol 75, pg 650, 1999), APPL PHYS L, 75(17), 1999, pp. 2692-2692
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
17
Year of publication
1999
Pages
2692 - 2692
Database
ISI
SICI code
0003-6951(19991025)75:17<2692:A(R3X2>2.0.ZU;2-H