ATOMIC-FORCE MICROSCOPY OF SOLUTION-GROWN POLYETHYLENE SINGLE-CRYSTALS

Atomic force microscopy (AFM) was applied to the precise thickness mea surements of thin lamellae about 10 nm thick of polyethylene single cr ystals which were grown from dilute solutions and precipitated on clea ved mica. The obtained values agree well with the thickness determined by small angle X-ray scattering. Moreover, AFM observation allowed de termination of the thickness difference of several angstroms in the di fferent growth sectors of small crystals about several mum wide. From the measurements, it was concluded that the free energy of the fold su rface in the {110} growth sector was 30% larger than the values in the {100} sector. The larger surface free energy in the {110} sector mean s higher fold energy in the growth sector.