Force microscopy techniques such as atomic force microscopy (AFM), fri
ction force microscopy (FFM), and force modulation microscopy (FMM) we
re applied to polymer blend and copolymer surfaces to observe phase-se
parated structures and distinguish the individual components. We obser
ved a continuous phase-separated structure of polystyrene (PS)/polyeth
yleneoxide (PEO) polymer blend, a micro-phase-separated structure of s
tyrene (S)/butadiene (B) S-B-S-B block copolymer, and islands-sea phas
e-separated structures of PS/polymethylmethacrylate (PMMA) polymer ble
nd and diblock copolymer with AFM. FFM and FMM were applied to PS/PMMA
polymer blend and diblock copolymer, and FFM differentiated PS from P
MMA.