Optimum near-far resistance for dual-rate DS/CDMA signals: Random signature sequence analysis

Authors
Citation
Jx. Chen et U. Mitra, Optimum near-far resistance for dual-rate DS/CDMA signals: Random signature sequence analysis, IEEE INFO T, 45(7), 1999, pp. 2434-2447
Citations number
22
Categorie Soggetti
Information Tecnology & Communication Systems
Journal title
IEEE TRANSACTIONS ON INFORMATION THEORY
ISSN journal
00189448 → ACNP
Volume
45
Issue
7
Year of publication
1999
Pages
2434 - 2447
Database
ISI
SICI code
0018-9448(199911)45:7<2434:ONRFDD>2.0.ZU;2-4
Abstract
Optimum near-far resistance is studied for synchronous dual-rate DS/CDMA sy stems. Three multirate access schemes are considered: multicode (MC) access where high-rate users multiplex their data bits onto multiple codes and fo rm a single-rate system; variable spreading length (VSL) access where the s preading lengths of signature sequences are inversely proportional to users ' data rates; and-variable chipping rate (VCR) access where the chipping ra tes of the signature sequences are proportional to users' data rates. In or der to remove the influence of signature sequences in the comparison of the three schemes, random signature sequences are assumed. Optimum near-far re sistance is then averaged over all possible realizations. Two types of code sets are considered for the VSL system: general random codes and random re petition codes. Bounds and approximations are provided for the average opti mum near-far resistance. Analytical results show that the performance depen ds on the access schemes and the data rate of the users. The results for th e VSL scheme with general random codes are extended for performance evaluat ion of systems with signature sequences which span many symbol intervals.