Fundamental characteristics of MgO film and their influence on the operation of plasma displays

Citation
K. Yoshida et al., Fundamental characteristics of MgO film and their influence on the operation of plasma displays, IEICE TR EL, E82C(10), 1999, pp. 1798-1803
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEICE TRANSACTIONS ON ELECTRONICS
ISSN journal
09168524 → ACNP
Volume
E82C
Issue
10
Year of publication
1999
Pages
1798 - 1803
Database
ISI
SICI code
0916-8524(199910)E82C:10<1798:FCOMFA>2.0.ZU;2-K
Abstract
The relationships between lattice orientation of the electron-beam evaporat ed MgO layer used as protecting layer for ac plasma displays (ac-PDPs) and the discharge characteristics of color ac-PDPs were investigated by the mea surements of ion-induced secondary electron emission. It is proved that val ues of gamma(i) for MgO are large in the order of (220) orientation, (200) orientation, and (111) orientation, that is, gamma(i)(220) > gamma(i)(200) > gamma(i)(111). The values of phi for different lattice orientation are ob tained by the measurements of thermionic emission and photo emission. The a ging measurements for testing panels with the different lattice orientation of MgO layer revealed that performance of those panels are excellent in th e order of (220), (200), and (111). In particular, luminance and luminous e fficiency become larger in the order of (220), (200), and (111). It is poin ted cut that the degree of longevity, sustaining voltage, and memory margin for ac-PDPs with protecting materials as MgO are estimated by the measurem ents of gamma(i).