Room-temperature vacancy migration in crystalline Si from an ion-implantedsurface layer

Migration of vacancies in crystalline, n-type silicon at room temperature f rom Ge+-implanted (150 keV, 5x10(9)-1x10(11) cm(-2)) surface layers was stu died by tracing the presence of P-V pairs (E centers) in the underlying lay er using deep level transient spectroscopy (DLTS). Under the conditions we have examined, the vacancies migrate to a maximum depth of about 1 mu m and at least one vacancy per implanted Ge ion migrates into the silicon crysta l. The annealing of the E centers is accompanied, in an almost one-to-one f ashion, by the appearance of a new DLTS line corresponding to a level at E- C-E(t)approximate to 0.15 eV that has donor character. It is argued that th e center associated with this line is most probably the P-2-V complex; it a nneals at about 550 K. A lower limit of the RT-diffusion coefficient of the doubly charged, negative vacancy is estimated to be 4x10(-11) cm(2)/s. (C) 1999 American Institute of Physics. [S0021-8979(99)05421-3].