Creep and electrical resistivity of metallic glass Ni78B14Si8 under protonirradiation

Plastic deformation and electrical resisitivity of the metallic glass Ni78B 14Si8 were measured during 6.3 MeV proton irradiation at approximate to 420 K under tensile stresses up to 430 MPa. Irradiation creep rate depended li nearly on stress sigma and particle flux Phi (or displacement rate K), givi ng epsilon*/sigma Phi approximate to 4.5x10(-33) m(2)/Pa (epsilon*/sigma K approximate to 5x10(-9) Pa-1 dpa(-1)). After recrystallization this value w as reduced by a factor of approximate to 25, falling into the range of poly crystalline pure nickel and dilute Ni alloys. The electrical resisitivity i n the amorphous state was decreasing under irradiation, while the initially lower resistivity of recrystallized material strongly increased. (C) 1999 American Institute of Physics. [S0021-8979(99)07321-1].