Evidence for the alteration of an organic/metal interface resulting from the formation of a broad interfacial layer

Citation
B. Bonello et al., Evidence for the alteration of an organic/metal interface resulting from the formation of a broad interfacial layer, J APPL PHYS, 86(9), 1999, pp. 4959-4963
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
9
Year of publication
1999
Pages
4959 - 4963
Database
ISI
SICI code
0021-8979(19991101)86:9<4959:EFTAOA>2.0.ZU;2-Y
Abstract
The alteration of the organic/electrode interface is partially responsible for the deterioration of the electrical efficiency of some molecular electr onic devices. We used the picosecond ultrasonics to investigate the changes that occur at the interface copper-phthalocyanine/M (M=Al or Au) after the electrode deposition: the absorption of an ultrashort laser pulse sets the heterostructure into vibration and the nature of the interface is deduced from the photoelastic response of the samples. We show that a broad interfa cial layer is formed, the thickness of which is estimated. We show also tha t the slow migration of metallic particles within the organic layer leads, after a few weeks, to a broadening of the interfacial region. (C) 1999 Amer ican Institute of Physics. [S0021-8979(99)03921-3].