Interdiffusion in NiMnSb/V/NiMnSb: X-ray and neutron reflectivity investigation of ion beam sputtered trilayer systems

Authors
Schlomka, JP Tolan, M Press, W Fitzsimmons, MR Siebrecht, R Schubert, DW Simon, P
Citation
Jp. Schlomka et al., Interdiffusion in NiMnSb/V/NiMnSb: X-ray and neutron reflectivity investigation of ion beam sputtered trilayer systems, J APPL PHYS, 86(9), 1999, pp. 5146-5151
Citations number
36
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
9
Year of publication
1999
Pages
5146 - 5151
Database
ISI
SICI code
0021-8979(19991101)86:9<5146:IINXAN>2.0.ZU;2-I
Abstract
The new trilayer system NiMnSb/V/NiMnSb on MgO(001) was investigated by mea ns of vibrating sample magnetometry (VSM), x-ray, and neutron reflectivity. VSM revealed a coercive field H-c=23 Oe and a hysteresis loop similar to t hat of an uncoupled ferromagnet. The x-ray and neutron reflectivity data pr oved that interface roughnesses of 10 Angstrom are present. A detailed anal ysis yielded significant interdiffusion at the NiMnSb/V interfaces which is one possible explanation for the weak magnetoresistance effect measured in similar NiMnSb-based multilayer systems. (C) 1999 American Institute of Ph ysics. [S0021- 8979(99)00921-4].