Dielectric properties of pulsed laser deposited films of PbMg1/3Nb2/3-PbTiO3 and PbSc1/2Nb1/2O3-PbTiO3 relaxor ferroelectrics

Citation
M. Tyunina et al., Dielectric properties of pulsed laser deposited films of PbMg1/3Nb2/3-PbTiO3 and PbSc1/2Nb1/2O3-PbTiO3 relaxor ferroelectrics, J APPL PHYS, 86(9), 1999, pp. 5179-5184
Citations number
34
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
9
Year of publication
1999
Pages
5179 - 5184
Database
ISI
SICI code
0021-8979(19991101)86:9<5179:DPOPLD>2.0.ZU;2-W
Abstract
Highly oriented perovskite films of PbMg1/3Nb2/3-PbTiO3 and PbSc1/2Nb1/2O3- PbTiO3 with compositions near the morphotropic phase boundary were formed b y pulsed laser deposition on La0.5Sr0.5CoO3/MgO (100). The dielectric prope rties of the films were studied over the frequency range of 100 Hz-1 MHz in the temperature range 20-350 degrees C. The room temperature polarization and dielectric permittivity of 250-nm-thick films were close to those in bu lk ceramics. The films exhibited relaxor-type behavior with thermal hystere sis and with the temperatures of the dielectric peaks corresponding to thos e in the bulk. The width of the transition in the films was larger than in bulk ceramics. The properties of the films were found to be influenced by t he small grain size rather than by the interfaces of the films. (C) 1999 Am erican Institute of Physics. [S0021- 8979(99)01921-0].