Study on the piezoresistive effect of crystalline and polycrystalline diamond under uniaxial strains

Citation
L. Fang et al., Study on the piezoresistive effect of crystalline and polycrystalline diamond under uniaxial strains, J APPL PHYS, 86(9), 1999, pp. 5185-5193
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
9
Year of publication
1999
Pages
5185 - 5193
Database
ISI
SICI code
0021-8979(19991101)86:9<5185:SOTPEO>2.0.ZU;2-R
Abstract
The piezoresistive effect of p-type crystalline materials under uniaxial st ress was analyzed by the deformation-potential theory and the valence-bands split-off model. The calculation formula of the gauge factor under the con dition of the strain-induced separation of the heavy- and light-hole bands was obtained. It is found that the great difference of the effective mass b etween the heavy and light hole in diamond is one of the main factors which are responsible for the piezoresistive effect in the p-type diamond. The p iezoresistive effect of the p-type polycrystalline material was also discus sed from the Mayadas-Shatzkes model. The results showed that the piezoresis tive effect of polycrystalline materials is related to both the valence-ban ds split off and the grain-boundary scattering. The grain-boundary scatteri ng played a role of decreasing the piezoresistive effect, which made the po lycrystalline materials have a smaller gauge factor than the crystalline ma terials. (C) 1999 American Institute of Physics. [S0021- 8979(99)02021-6].