L. Fang et al., Study on the piezoresistive effect of crystalline and polycrystalline diamond under uniaxial strains, J APPL PHYS, 86(9), 1999, pp. 5185-5193
The piezoresistive effect of p-type crystalline materials under uniaxial st
ress was analyzed by the deformation-potential theory and the valence-bands
split-off model. The calculation formula of the gauge factor under the con
dition of the strain-induced separation of the heavy- and light-hole bands
was obtained. It is found that the great difference of the effective mass b
etween the heavy and light hole in diamond is one of the main factors which
are responsible for the piezoresistive effect in the p-type diamond. The p
iezoresistive effect of the p-type polycrystalline material was also discus
sed from the Mayadas-Shatzkes model. The results showed that the piezoresis
tive effect of polycrystalline materials is related to both the valence-ban
ds split off and the grain-boundary scattering. The grain-boundary scatteri
ng played a role of decreasing the piezoresistive effect, which made the po
lycrystalline materials have a smaller gauge factor than the crystalline ma
terials. (C) 1999 American Institute of Physics. [S0021- 8979(99)02021-6].