We report on the fabrication and characterization of In1-xGaxAs quantum str
uctures on V-grooved InP substrates grown by metalorganic vapor phase epita
xy. The geometry of the quantum wells and wires was determined by scanning-
electron microscopy and atomic-force microscopy. We optimized the InP buffe
r-layer thickness in order to obtain narrow quantum wires. The optical prop
erties were studied by photoluminescence (PL) spectroscopy. The PL peaks of
the different quantum structures can be identified by a self-aligned maski
ng process. The interpretation of the PL measurements was verified by means
of cathodoluminescence measurements with high spatial resolution. Transiti
on energies were evaluated from the geometry of the quantum wells and quant
um wires. The composition of the InGaAs was used as a parameter for the cal
culations. By comparison of the measured transition energies with the evalu
ated ones we determined the Ga content of the quantum structures. We found
the quantum wires nearly lattice matched to the InP substrate and the quant
um wells on {111} planes rich in In (1-x=71%). (C) 1999 American Institute
of Physics. [S0021-8979(99)00621-0].