A detailed dynamical analysis of an all solid-state THz source is given. Th
is is based on the polarization-induced autonomous oscillation in resonant
tunneling heterostructure with staggered band-gap alignment. The physical m
odel consists of the following processes: (a) Generation by Zener tunneling
of holes trapped in the barrier and electrons drifting in the depletion la
yer of the drain, whose rate decreases with the polarization between the ba
rrier and quantum well. (b) Stimulated generation of barrier-well polarizat
ion. (c) Nonradiative decay of barrier-well polarization through barrier-ho
le recombination and quantum-well electron discharge. It is shown that a li
mit cycle oscillation of the barrier-well polarization and trapped-hole cha
rge in the barrier can occur which induce THz oscillations in the resonant
tunneling current across the device. The time-averaged results agree with t
he measured current-voltage characteristic of AlGaSb/InAs/AlGaSb staggered
band-gap double-barrier structure. In particular, the measured smaller curr
ent offset at forward bias compared to that of reverse bias in the current-
voltage hysteresis loop is predicted by our physical model and limit cycle
analysis. Thus, we have experimental evidence indicating the correctness of
our approach and the promising potential of this device as a novel all sol
id-state THz source. (C) 1999 American Institute of Physics. [S0021-8979(99
)07221-7].