Intrinsic trapping sites in rare-earth and yttrium oxyorthosilicates

Citation
Dw. Cooke et al., Intrinsic trapping sites in rare-earth and yttrium oxyorthosilicates, J APPL PHYS, 86(9), 1999, pp. 5308-5310
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
9
Year of publication
1999
Pages
5308 - 5310
Database
ISI
SICI code
0021-8979(19991101)86:9<5308:ITSIRA>2.0.ZU;2-I
Abstract
Similarity among the thermally stimulated luminescence glow curves of undop ed Lu2SiO5 and Ce3+-doped oxyorthosilicates possessing the monoclinic C2/c structure strongly suggests the luminescence traps are intrinsic in origin. They are most likely associated with the configuration of oxygen ions in t he vicinity of not only the Ce3+ ion, as suggested in previous work, but al so the host lanthanide ion. The optical absorption spectrum of pristine Lu2 SiO5 shows the presence of intrinsic absorption centers that are enhanced u pon x irradiation as seen in other oxides containing oxygen related point d efects. (C) 1999 American Institute of Physics. [S0021-8979(99)06921-2].