This paper reports for the first time the successful growth of a single GaN
layer on an amorphous glass substrate using metal organic chemical vapor d
eposition (MOCVD) technique. The layers were characterized by room temperat
ure photoluminescence and X-ray diffraction measurements. In addition, the
lateral overgrowth of GaN on this substrate was also tried, which could pro
vide an effective method to obtain high-quality GaN substrates in the near
future. In comparison to the overgrowth on sapphire substrate, the lateral
overgrowth on our substrate is independent of the mask stripe direction, wh
ich could indicate a different growth mechanism. (C) 1999 Elsevier Science
B.V. All rights reserved.