"Reliability in VLSI Circuits: Operation, Manufacturing and Design" - June28-July 4, 1999 - Autrans, France - Preface

Authors
Boussey, J Reimbold, G
Citation
J. Boussey et G. Reimbold, "Reliability in VLSI Circuits: Operation, Manufacturing and Design" - June28-July 4, 1999 - Autrans, France - Preface, MICROEL ENG, 49(1-2), 1999, pp. 1-2
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
49
Issue
1-2
Year of publication
1999
Pages
1 - 2
Database
ISI
SICI code
0167-9317(199911)49:1-2<1:"IVCOM>2.0.ZU;2-R