Citation
M. Vallet et P. Sardin, Electrical testing for failure analysis: E-beam testing, MICROEL ENG, 49(1-2), 1999, pp. 157-167
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317
→ ACNP
Volume
49
Issue
1-2
Year of publication
1999
Pages
157 - 167
Database
ISI
SICI code
0167-9317(199911)49:1-2<157:ETFFAE>2.0.ZU;2-3