Evaluation of inelastic energy losses for low-energy Ne+ ions scattered from aluminum and silicon surfaces

Citation
A. Tolstogouzov et al., Evaluation of inelastic energy losses for low-energy Ne+ ions scattered from aluminum and silicon surfaces, SURF SCI, 441(1), 1999, pp. 213-222
Citations number
38
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
441
Issue
1
Year of publication
1999
Pages
213 - 222
Database
ISI
SICI code
0039-6028(19991020)441:1<213:EOIELF>2.0.ZU;2-I
Abstract
The purpose of our work is a thorough experimental study of low-energy Ne+- ion scattering from aluminum and silicon by using an advanced mass-energy s pectrometer operated with the true scattering angle, i.e., without any elec tric fields between the target and the analyzer; this paper reports an asse ssment of inelastic energy losses. Accurate evaluation of the average inela sticity for low-energy Ne+ confirmed literature data (Q = 45 +/- 5 eV), but only for Ne+-to-Al. It was found that the mean value of inelasticity for N e+-to-Si was about 55 +/- 5 eV. Different inelastic losses for the neon pri mary-ion isotopes (Ne-20(+) and Ne-22(+)) scattered from aluminum and silic on targets, as well as for the doubly charged ions Ne2+, were evaluated. Ne w data concerning the dependence of inelasticity on the primary energy were obtained. (C) 1999 Elsevier Science B.V. All rights reserved.