A NEW METHOD TO DETERMINE THE CRITICAL-CURRENT DENSITY OF SUPERCONDUCTING THIN-FILMS BASED ON MAGNETOOPTIC MEASUREMENTS

Citation
R. Knorpp et al., A NEW METHOD TO DETERMINE THE CRITICAL-CURRENT DENSITY OF SUPERCONDUCTING THIN-FILMS BASED ON MAGNETOOPTIC MEASUREMENTS, Physica. C, Superconductivity, 230(1-2), 1994, pp. 128-134
Citations number
13
Categorie Soggetti
Physics, Applied
ISSN journal
09214534
Volume
230
Issue
1-2
Year of publication
1994
Pages
128 - 134
Database
ISI
SICI code
0921-4534(1994)230:1-2<128:ANMTDT>2.0.ZU;2-U
Abstract
Direct observation and measurement of the spatial flux density distrib ution on the surface of Y1Ba2Cu3O7-x, superconducting thin films under application of an external magnetic field are performed using magneto -optical EUS/EuF2 and iron-garnet indicators. A new, very accurate met hod to determine the critical current density of stripe-structured thi n films is presented, based on a recent theory for flux penetration in superconducting thin films.