Room-temperature recombination dynamics has been investigated in a large se
t of different Cu(In,Ga)Se-2 absorber films and compared to the electrical
device characteristics of the respective solar cell modules. For a given ce
ll preparation process, a characteristic relation between the low-injection
minority-carrier lifetime of the absorber layers and the conversion effici
ency of the solar cells is observed: Long lifetimes correlate with high ope
n circuit voltages and conversion efficiencies, while no significant influe
nce of the lifetime on the short circuit current is found. (C) 1998 America
n Institute of Physics. [S0003-6951(98)01635-0].