Photoreflectance of GaSb/Al0.4Ga0.6Sb single quantum wells

Citation
M. Geddo et al., Photoreflectance of GaSb/Al0.4Ga0.6Sb single quantum wells, APPL PHYS L, 73(9), 1998, pp. 1254-1256
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
73
Issue
9
Year of publication
1998
Pages
1254 - 1256
Database
ISI
SICI code
0003-6951(199808)73:9<1254:POGSQW>2.0.ZU;2-M
Abstract
We report a photoreflectance study conducted in the 0.7-1.2 eV photon energ y range and at temperatures from 80 to 300 K of GaSb/Al0.4Ga0.6Sb single qu antum wells grown by molecular beam epitaxy. We observed clear and well-res olved structures, which could be attributed to the interband optical transi tions originating in both the GaSb buffer and the quantum wells, and which could be fitted by standard critical-point line shapes. Our results demonst rate that even unintentionally doped GaSb-based quantum systems can be stud ied and characterized by photoreflectance, especially at low temperatures. (C) 1998 American Institute of Physics, [S0003-6951(98)00235-6].