Timing characteristics of a Cd1-xZnxTe detector-based X-ray imaging system

Authors
Giakos, GC Vedantham, S Chowdhury, S Odogba, J Dasgupta, A Guntupalli, R Suryanarayanan, S Vega-Lozada, V Sridhar, M Khyati, M Shah, N
Citation
Gc. Giakos et al., Timing characteristics of a Cd1-xZnxTe detector-based X-ray imaging system, IEEE INSTR, 48(5), 1999, pp. 909-914
Citations number
72
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN journal
00189456 → ACNP
Volume
48
Issue
5
Year of publication
1999
Pages
909 - 914
Database
ISI
SICI code
0018-9456(199910)48:5<909:TCOACD>2.0.ZU;2-6
Abstract
The timing characteristics of a planar Cd1-xZnxTe sample at each frequency of a scanning square-wave test pattern, has been measured. This study is ai med at evaluating the speed characteristics of a Cd1-xZnxTe detector for X- ray imaging and computed tomographic (CT) applications. The experimental re sults of this study indicate that the temporal response of a Cd1-xZnxTe det ector based X-ray system, improves significantly by optimizing the X-ray tu be and detector parameters.