Influence of the architecture on ADC error modeling

Citation
P. Arpaia et al., Influence of the architecture on ADC error modeling, IEEE INSTR, 48(5), 1999, pp. 956-966
Citations number
40
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN journal
00189456 → ACNP
Volume
48
Issue
5
Year of publication
1999
Pages
956 - 966
Database
ISI
SICI code
0018-9456(199910)48:5<956:IOTAOA>2.0.ZU;2-Z
Abstract
The influence of the architecture on analog-to-digital converter modeling i s investigated for the three most widespread architectures: integrating, su ccessive approximations, and Bash. The effects of main error sources are an alyzed in terms of integral and differential nonlinearity with the aim of s etting up a unified error model. Such a model is useful both to economicall y generate a look-up table for error correction and to quickly produce diag nosis models for fault detection and isolation. Numerical simulations aimed to show the model effectiveness and experimental tests carried out to vali date the model are discussed.