The influence of the architecture on analog-to-digital converter modeling i
s investigated for the three most widespread architectures: integrating, su
ccessive approximations, and Bash. The effects of main error sources are an
alyzed in terms of integral and differential nonlinearity with the aim of s
etting up a unified error model. Such a model is useful both to economicall
y generate a look-up table for error correction and to quickly produce diag
nosis models for fault detection and isolation. Numerical simulations aimed
to show the model effectiveness and experimental tests carried out to vali
date the model are discussed.