Laser-enhanced negative ion mass spectroscopy for weakly electron-attaching species

Citation
La. Pinnaduwage et al., Laser-enhanced negative ion mass spectroscopy for weakly electron-attaching species, INT J MASS, 193(1), 1999, pp. 77-86
Citations number
25
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
ISSN journal
13873806 → ACNP
Volume
193
Issue
1
Year of publication
1999
Pages
77 - 86
Database
ISI
SICI code
1387-3806(19991028)193:1<77:LNIMSF>2.0.ZU;2-G
Abstract
We report the first observation of efficient negative ion formation in exci mer-laser irradiated benzene and toluene. These negative ions were formed v ia enhanced electron attachment to highly-excited states produced by the la ser radiation. The potential of this technique as an analytical tool is dis cussed. Due to the general nature of the enhanced electron attachment mecha nism involved, this technique can be expected to be applicable for a wide v ariety of molecules. (Int J Mass Spectrom 193 (1999) 77-86) (C) 1999 Elsevi er Science B.V.