Yf. Li et al., Memory effect and temperature behavior in spin valves with and without antiferromagnetic subsystems, J APPL PHYS, 86(10), 1999, pp. 5692-5695
Temperature behavior and memory effect in standard spin valves (SV) and SVs
with synthetic antiferromagnetic (Co/Ru/Co) (SV-SAF) subsystems have been
studied. SV-SAFs show much better temperature stability. Memory effect refe
rs to the phenomenon that the exchange bias can be altered at temperatures
(T-R's) much lower than the blocking temperature (T-B), and these temperatu
res (T-R's) are imprinted into SVs. The memory effect greatly deteriorates
the magnetoresistance behaviors in SV. Our results suggest that the memory
effect is caused by a distribution of local blocking temperatures (T-b's).
The magnetization state in the pinned layer is critical in determining the
temperature behavior of H-E and magnetoresistance. By partially reversing t
he magnetization in the pinned ferromagnetic (FM) layers, we are able to se
parate the temperature dependencies of the local exchange bias (H-e) associ
ated with regions consisting of different T-b's. Two features have been obs
erved: (1) the local exchange bias (H-e) with a narrow T-b distribution has
a weak temperature dependence; (2) the simple algebraic sum of local H-e's
nearly reproduce the total H-E with the difference between these two quant
ities representing the domain wall energy in the FM layer. On the other han
d, SV-SAFs show strong resistance to memory effects because of two factors;
the strong exchange coupling through the Ru layer, and the net magnetic mo
ment of Co/Ru/Co layers in SV-SAF being close to zero. The former makes the
two SV-SAF FM layers behave coherently, while the latter makes the interac
tion between the SV-SAF and the external field negligibly small. (C) 1999 A
merican Institute of Physics. [S0021-8979(99)08621-1].