Y. Kobayashi et al., On extended energy-loss fine structure data analysis for obtaining reliable structural parameters, J ELEC MICR, 48(5), 1999, pp. 525-529
We examined extended energy-loss fine structure (EXELFS) data analysis for
obtaining reliable values of structural parameters, and its practical guide
lines are presented. We found that the ratio method is unstable and gives r
eliable results only when the calculated radial distribution function shows
good peak separation, whereas the curve-fitting is rather robust for the q
uantitative analysis. We introduced a simple optimization method to avoid t
he instability associated with the ratio method so that two experiments on
the same area at different temperatures should give time same coordination
number. The coordination number and Debye-Waller factor derived from the ar
ea having different thickness resulted in the same values within the experi
mental accuracy up to the thickness of 0.4 lambda (lambda: plasmon mean fre
e path), while the inter-atomic distance was linearly decreased with sample
thickness also up to that thickness. This suggests that EXELFS experiments
must be conducted for sample thickness <0.4 lambda.