The technique of Small Angle Neutron Scattering (SANS) has been used to inv
estigate the microstructure, at the nanoscale level, of SiO2 gels at differ
ent processing stages. The samples were prepared by the alkoxide route of t
he sol-gel process with different pH values. They were measured as xerogels
after heat treatment at different temperatures and as wet gels at the gel
point and after aging at 60 degrees C. SANS measurements confirmed that pH
has a strong influence upon the nanostructure of gels. The present work rep
orts the main SANS results obtained in this investigation and their interpr
etation. (C) 1999 Elsevier Science B.V. All rights reserved.