The photodissociation dynamics of thiophene, c-C4H4S, have been studied at
193 nm using tunable synchrotron undulator radiation as a universal product
probe. Five primary dissociation channels have been observed, and the tran
slational energy distributions and photoionization efficiency spectra have
been recorded for all products. The evidence suggests that dissociation occ
urs on the ground-state surface following internal conversion.