Characterization of the Ge(001)/Si-(2 x 1) surface using lattice dynamics

Citation
Hm. Tutuncu et al., Characterization of the Ge(001)/Si-(2 x 1) surface using lattice dynamics, PHYS REV B, 60(15), 1999, pp. 10648-10651
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
60
Issue
15
Year of publication
1999
Pages
10648 - 10651
Database
ISI
SICI code
0163-1829(19991015)60:15<10648:COTGX1>2.0.ZU;2-P
Abstract
We present lattice dynamical calculations for segregated and nonsegregated models of the monolayer Si-covered Ge(001) surface. The calculations were p erformed using the adiabatic bend-charge model, with structural parameters and electronic charge distributions taken from recent ab initio pseudopoten tial calculations. We find that adsorption of Si results in several charact eristic phonon modes above the bulk continuum. These modes constitute a sig nature that may be used to distinguish between surface and subsurface Si ad sorbate layers. [S0163-1829(99)00840-1].