Tip-to-surface distance variations vs voltage in scanning tunneling microscopy

Citation
G. Seine et al., Tip-to-surface distance variations vs voltage in scanning tunneling microscopy, PHYS REV B, 60(15), 1999, pp. 11045-11050
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
60
Issue
15
Year of publication
1999
Pages
11045 - 11050
Database
ISI
SICI code
0163-1829(19991015)60:15<11045:TDVVVI>2.0.ZU;2-P
Abstract
This paper presents an experimental and theoretical study of distance vs vo ltage characteristics of Au/Au tunnel junctions in air and UHV. Qualitative and quantitative results are compared with the classical models of Tersoff and Hamann and Simmons. To fit experimental conditions, the Simmons model has been extended in three dimensions using a hyperboloidal tip. However, a large discrepancy between theoretical and experimental quantitative result s has been found in air because of barrier height lowering due to electrode contamination. An experimental rescaling factor is used in the modified Si mmons model to fit any s(V) curve with high accuracy. These results are mai nly interpreted in terms of gold surface elastic deformations. [S0163-1829( 99)11635-7].