The conservative and dissipative forces between tip and sample of a dynamic
atomic force microscopy (AFM) were investigated using a combination of com
puter simulations and experimental AFM data obtained by the frequency modul
ation technique. In this way it became possible to reconstruct complete for
ce versus distance curves and damping coefficient versus distance curves fr
om experimental data without using fit parameters for the interaction force
and without using analytical interaction models. A comparison with analyti
cal approaches is given and a way to determine a damping coefficient curve
from experimental data is proposed. The results include the determination o
f the first point of repulsive contact of a vibrating tip when approaching
a sample. The capability of quantifying the tip-sample interaction is demon
strated using experimental data obtained with a silicon tip and a mica samp
le in UHV. [S0163-1829(99)01839-1].