Dynamical LEED study of Pt(111)-(root 3x root 3)R30 degrees-Xe

Authors
Seyller, T Caragiu, M Diehl, RD Kaukasoina, P Lindroos, M
Citation
T. Seyller et al., Dynamical LEED study of Pt(111)-(root 3x root 3)R30 degrees-Xe, PHYS REV B, 60(15), 1999, pp. 11084-11088
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
60
Issue
15
Year of publication
1999
Pages
11084 - 11088
Database
ISI
SICI code
0163-1829(19991015)60:15<11084:DLSOP3>2.0.ZU;2-7
Abstract
Low-energy electron diffraction (LEED) studies of Pt(111)-(root 3 x root 3) R30 degrees-Xe at 80 K and 110 K indicate that the Xe adsorption site is on top of the Pt atoms with a Xe-Pt distance of 3.4 Angstrom. The substrate s tructure is essentially unrelaxed with respect to die bulk. These results c ontrast with an earlier spin-polarized LEED study which indicated that holl ow sites are occupied in this structure. The low-coordination-site geometry for Xe is discussed in the context of earlier studies of Xe adsorption. [S 0163-1829(99)03939-9].