A. Ritschel et al., An electrochemical enrichment procedure for the determination of heavy metals by total-reflection X-ray fluorescence spectroscopy, SPECT ACT B, 54(10), 1999, pp. 1449-1454
An electrolytic separation and enrichment technique was developed for the d
etermination of trace elements by total-reflection X-ray fluorescence spect
roscopy (TXRF). The elements of interest are electrodeposited out of the sa
mple solution onto a solid, polished disc of pure niobium which is used as
sample carrier for the TXRF measurement. The electrochemical deposition lea
ds to a high enrichment of the analytes and at the same time to a removal o
f the matrix. This results in substantially improved detection limits in th
e lower picogram per gram region. The deposited elements ale directly measu
red by TXRF without any further sample preparation step. The homogeneous th
in layer of the analytes is an ideal sample form for TXRF, because scattere
d radiation from the sample itself is minimized. The proposed sample prepar
ation method is useful particularly for the analysis of heavy metals in liq
uid samples with for TXRF disturbing matrices, e.g. sea water. (C) 1999 Els
evier Science B.V. All rights reserved.