The grazing-exit technique is applied to particle-induced X-ray emission (P
IXE) analysis of thin-films and aerosols deposited on nat silicon wafers. P
IXE is known as a trace-analytical method; however, Bremsstrahlung backgrou
nd is still important in the low-energy region. A 2.5 MeV proton beam bomba
rded the sample at an incident angle of 90 degrees, and the emitted X-rays
were detected at grazing exit angles by using an energy-dispersive detector
. When the characteristic X-rays were measured at grazing exit angles, this
background almost disappeared. The characteristic X-rays of Ca K alpha and
Zn K alpha emitted from atmospheric particles could hardly be observed by
PIXE in the normal arrangement; however, they were clearly observed with lo
w background under grazing-exit conditions. The detection limit for Ca was
improved by a factor of 7, It is also demonstrated that analysis of the top
most layer and depth analysis for double-layered samples are both possible
by adjusting the exit angle. Consequently, grazing-exit PIXE is a promising
method for surface-, micro-, and trace analysis.