Fourier analysis applied to the characterization of optical wedges with small angles

Citation
R. Castaneda et J. Garcia-sucerquia, Fourier analysis applied to the characterization of optical wedges with small angles, APPL OPTICS, 38(31), 1999, pp. 6522-6527
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
38
Issue
31
Year of publication
1999
Pages
6522 - 6527
Database
ISI
SICI code
0003-6935(19991101)38:31<6522:FAATTC>2.0.ZU;2-E
Abstract
A technique for the measurement of optical wedge parameters is shown. It is based on the analysis of the Fourier transform of an interferogram-intensi ty register. In this domain the angle and the edge orientations of the opti cal wedge can be determined through a much simpler procedure than the usual interferogram fringe analysis. (C) 1999 Optical Society of America. OCIS c odes: 070.2590, 120.3180,220.4840.