Rd. Redwing et al., Observation of strong to Josephson-coupled crossover in 10 degrees YBa2Cu3Ox bicrystal junctions, APPL PHYS L, 75(20), 1999, pp. 3171-3173
A temperature-dependent strong to weak (Josephson) coupling crossover near
75 K is observed for 10 degrees misorientation YBa2Cu3Ox grain boundaries.
Below 75 K the current-voltage characteristic (IVC) shows strongly coupled,
flux-flow behavior. Above 75 K, the IVC is Josephson coupled. The data are
consistent with a network of microbridges at the grain boundary defined by
dislocation strain fields. The data are compared to recent calculations by
A. Gurevich and A. E. Pashitskii [Phys. Rev. B 57, 13878 (1998)]. The char
acteristic voltages for these low-angle grain boundaries are higher than hi
gh-angle boundaries at 77 K, and could lead to improved high-temperature su
perconducting device operation in this temperature range. (C) 1999 American
Institute of Physics. [S0003-6951(99)03046-6].