Nanoscale investigation of domain retention in preferentially oriented PbZr0.53Ti0.47O3 thin films on Pt and on LaNiO3

Authors
Hong, JW Jo, W Kim, DC Cho, SM Nam, HJ Lee, HM Bu, JU
Citation
Jw. Hong et al., Nanoscale investigation of domain retention in preferentially oriented PbZr0.53Ti0.47O3 thin films on Pt and on LaNiO3, APPL PHYS L, 75(20), 1999, pp. 3183-3185
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
20
Year of publication
1999
Pages
3183 - 3185
Database
ISI
SICI code
0003-6951(19991115)75:20<3183:NIODRI>2.0.ZU;2-B
Abstract
We report results on domain retention in preferentially oriented PbZr0.53Ti 0.47O3 (PZT) thin films on Pt and on LaNiO3 (LNO) electrodes. Domain images are obtained by detecting an electrostatic force exerted on the biased con ductive probe. We demonstrate that polarization loss of PZT domains on LNO electrodes occurs less under no external field rather than that of PZT on P t. The time dependence of the remnant polarization is found to follow a str etched exponential decay. (C) 1999 American Institute of Physics. [S0003-69 51(99)01146-8].