J. Szepvolgyi et I. Mohai, Crystallization of an amorphous silicon nitride powder produced in a radiofrequency thermal plasma, CERAM INT, 25(8), 1999, pp. 711-715
Crystallization behavior of an amorphous silicon nitride powder produced in
an RF thermal plasma by the vapor-phase reaction of silicon tetrachloride
and ammonia has been investigated. Effects of annealing conditions such as
temperature and duration of heat treatment on the properties of powders wer
e studied. Changes in the chemical and phase compositions, as well as in th
e morphology of powders were measured and interpreted. Annealing of the amo
rphous silicon nitride powder at 1450 degrees C for 120 min resulted in a p
owder of about 80% crystalline phase content with an alpha/beta ratio of ab
out 6.5. (C) 1999 Elsevier Science Ltd and Techna S.r.l. All rights reserve
d.