Single-electron memory fabricated from doped silicon-on-insulator film

Citation
T. Sakamoto et al., Single-electron memory fabricated from doped silicon-on-insulator film, JPN J A P 1, 38(10), 1999, pp. 5851-5852
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
38
Issue
10
Year of publication
1999
Pages
5851 - 5852
Database
ISI
SICI code
Abstract
We investigated a memory device that uses a single-electron transistor as t he read-out component and a Si floating dot as the memory node. The device was fabricated fi om highly-doped silicon-on-insulator (SOI) film by using electron-beam lithography and a high-resolution resist (calixarene). We obs erved the charging and discharging of the floating dot and determined that the memory operation was not affected by the background charge, which is cr ucial for single-electron devices.