We investigated a memory device that uses a single-electron transistor as t
he read-out component and a Si floating dot as the memory node. The device
was fabricated fi om highly-doped silicon-on-insulator (SOI) film by using
electron-beam lithography and a high-resolution resist (calixarene). We obs
erved the charging and discharging of the floating dot and determined that
the memory operation was not affected by the background charge, which is cr
ucial for single-electron devices.