High-resolution observation of SrTiO3 interface by convergent beam illumination

The convergent beam illumination method has previously been proposed in ord er to determine the atomic arrangement in surface or interface structures o n the sub-nanometer order. This method reduces interference fringes that ap pear at the surface or interface, and the fine structure can be analyzed. I n this paper, the atomic arrangement near a SrTiO3 interface is determined from a transmission electron microscope image taken with convergent beam il lumination. A cycloidal undulated structure can be found at the interface t hat is caused from misorientation of two crystals on each side of the inter face. This structure cannot be found from images taken under conventional c ondition, and therefore, it shows that the convergent beam illumination met hod is useful for analyzing the local structures.